NeuSight™

NeuSight™ is a cutting-edge AI solution revolutionizing the machine vision industry through specialized anomaly and abnormal detection applications. By leveraging advanced AI model training capabilities, we empower businesses to quickly identify and respond to deviations in their visual inspection processes. Our adaptable platform is designed to boost productivity while maintaining high accuracy, making quality control more efficient and reliable than ever before.

Overview

See More, Detect Better
Efficiency Through Intelligence

NeuSight™ represents the pinnacle of AI-driven machine vision technology, offering an advanced service platform that excels in anomaly and abnormal detection. Engineered with state-of-the-art AI algorithms and seamless integration capabilities, it processes over 35,000 videos daily with zero false alarms. This powerful solution empowers semiconductor manufacturers and other industries to achieve superior quality control while reducing operational costs by up to 70%.

NeuSight™ brings next-generation AI capabilities to industrial machine vision, delivering a comprehensive solution for automated quality control and inspection. As a specialized AI-as-a-Service platform, it excels in detecting anomalies and abnormalities across manufacturing processes, with particular strength in semiconductor applications. By combining rapid processing, precise detection, and seamless integration, NeuSight™ enables businesses to achieve new levels of productivity and quality assurance.

Key Feature

Customizable AI-as-a-Service Platform

Seamless workflow integration
Adaptable deployment selection
Tailored model training for specific needs
Comprehensive seven-step service flow

Advanced GPU-Powered Processing

High-speed video detection
Real-time image analysis
Efficient data processing
GPU server optimization

Intelligent Anomaly Detection System

Zero false alarm rate
30x faster video detection compared to market alternatives
Advanced machine learning algorithms
Real-time monitoring and analysis

Scalable Architecture

Flexible deployment options (on-premises/cloud)
Integrated data storage system
Comprehensive verification process
Optional deployment customization

Key Benefit

Cost Efficiency

40% reduction in equipment costs
70% reduction in server room requirements
70% decrease in electricity bills
Optimized resource utilization

Enhanced Productivity

Eliminates manual inspections
Streamlined deployment process
Minimized downtime and disruption
Early intervention capabilities

Superior Detection Accuracy

Zero false alarm rate
Comprehensive defect detection
High-precision analysis
Real-time monitoring

Operational Excellence

Processes around 35k videos per day
Substantial increase in yield rates
Rapid deployment and integration
Early defect mitigation

Enhancing Yield Rates in Semiconductor Manufacturing with NeuSight™ Al

Solution :
NeuSight™ Al for Litho Abnormal Detection

NeuSight™, an innovative Al service specializing in anomaly detection applications, stepped in to address the client's challenges. Leveraging NeuSight™'s rapid and adaptable Al model training service, the client embarked on a journey to enhance their anomaly detection capabilities in lithography.

Customer Challenge :

In semiconductor manufacturing, lithography plays a critical role in creating intricate patterns on silicon wafers. However, even minor anomalies or defects in the lithography process can lead to significant yield losses and impact the final product's quality. The client faced challenges in accurately detecting and swiftly addressing anomalies during the lithography process, impacting their yield rates and overall productivity.

The Implementation Process

Data Integration and Analysis

NeuSight™ worked with the client to integrate diverse data sources from the lithography process, including imaging data and sensor readings.
Through comprehensive data analysis, NeuSight™ identified key patterns and anomalies critical for effective detection.

Custom Al Model Development

Leveraging advanced machine learning algorithms, NeuSight™ developed a custom Al model tailored to the client's specific lithography anomaly detection needs. The model was trained on extensive datasets to ensure robust performance and high accuracy.

Deployment and Optimization

NeuSight™ deployed the Al solution across the client's infrastructure, optimizing performance for GPU servers, on-premise systems, and cloud platforms. Rigorous testing and fine-tuning were conducted to ensure seamless integration and maximum efficiency.

Results